Title :
Reliability testing of PV modules
Author :
Wohlgemuth, John H.
Author_Institution :
Solarex Corp., Frederick, MD, USA
Abstract :
The reliability of PV modules is critical to their acceptance in the market place. The success that PV has achieved is in large part due to the proven reliability of crystalline silicon modules. This paper discusses the development of reliability testing of PV modules, explaining how accelerated stress tests are developed and what they can tell about the product. Those tests usually included in qualification test sequences are reviewed in terms of the stress or failure mechanism being tested, what lifetime or reliability predictions can be made from the results and how the tests can be extended to provide additional reliability information. Several new tests, the UV and Bypass Diode Tests, are presented. Limitations to extending qualification and reliability testing to new technology modules is also discussed
Keywords :
life testing; semiconductor device reliability; semiconductor device testing; solar cell arrays; solar cells; stress analysis; Bypass Diode Test; PV modules; UV test; accelerated stress tests; crystalline silicon modules; failure mechanism; lifetime prediction; qualification test sequences; reliability prediction; reliability testing; stress mechanism; Crystallization; Diodes; Failure analysis; Life estimation; Life testing; Manufacturing; Performance evaluation; Qualifications; Silicon; Stress;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520104
