Title :
Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC
Author_Institution :
Dept. of Comput. Eng., Vladimir State Univ., Vladimir, Russia
Abstract :
The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.
Keywords :
active filters; analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; oscillators; active filter; analog IC; built-in self-test; mixed-signal IC; oscillator; Radiation detectors; Robots; Switches;
Conference_Titel :
Electronics Conference (BEC), 2010 12th Biennial Baltic
Conference_Location :
Tallinn
Print_ISBN :
978-1-4244-7356-4
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2010.5630220
