• DocumentCode
    2986929
  • Title

    The Present State of the Art of Wide-Bandgap Semiconductors and Their Future

  • Author

    Rosker, Mark J.

  • Author_Institution
    Defense Adv. Res. Projects Agency, Arlington
  • fYear
    2007
  • fDate
    3-5 June 2007
  • Firstpage
    159
  • Lastpage
    162
  • Abstract
    This paper summarizes recent improvements in the performance and reliability of microwave and millimeter-wave wide-bandgap gallium nitride on silicon carbide devices and their promise for future integrated circuits. Many recent advances have been made as a result of the on-going Phase II wide band gap semiconductor for RF applications (WBGS-RF) program funded by the Defense Advanced Research Projects Agency (DARPA). During Phase II of the program, significant progress has been made toward realizing wide-bandgap devices that provide outstanding performance at reliability levels that will allow their use in a wide variety of high power applications.
  • Keywords
    MIMIC; silicon compounds; wide band gap semiconductors; GaN; RF Applications; SiC; integrated circuits; millimeter-wave wide-bandgap gallium nitride; reliability levels; silcon carbide devices; wide-bandgap semiconductors; Gallium nitride; HEMTs; III-V semiconductor materials; MMICs; Microwave devices; Power amplifiers; Semiconductor device reliability; Silicon carbide; Substrates; Wide band gap semiconductors; GaN; HEMT; MMIC; SiC; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1529-2517
  • Print_ISBN
    1-4244-0530-0
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2007.380855
  • Filename
    4266403