DocumentCode :
2986966
Title :
Characterization and Modeling of Metal/Double-Insulator/Metal Diodes for Millimeter Wave Wireless Receiver Applications
Author :
Rockwell, Stephen ; Lim, Derrick ; Bosco, Bruce A. ; Baker, Jeffrey H. ; Eliasson, Blake ; Forsyth, Keith ; Cromar, Michael
Author_Institution :
Motorola Labs, Tempe
fYear :
2007
fDate :
3-5 June 2007
Firstpage :
171
Lastpage :
174
Abstract :
In this paper we present measurements, models, and circuit implementations for a new low cost, thin film, metal/double-insulator/metal (MIIM) based tunneling diode technology. The device technology uses two insulators to form a tunneling device with very high speed performance capability, and is potentially compatible with many substrate technologies. This technology can potentially reduce cost, size, and improve performance for applications associated with high-speed communications, automotive collision avoidance and navigation, and homeland security weapons detection. Measured results of DC, S-parameter, and responsivity measurements in the 60 GHz band will be presented, including unmatched responsivity at 60 GHz of over 1000 V/W at -20 dBm, which is competitive with detector diodes on GaAs or Sb-based materials. ADS-compatible non-linear models are developed and demonstrated, and an envelope detector design and results is presented.
Keywords :
MIM devices; millimetre wave receivers; radio receivers; tunnel diodes; automotive collision avoidance; automotive navigation; frequency 60 GHz; homeland security weapons detection; metal/double-insulator/metal diodes; millimeter wave wireless receiver; tunneling device; tunneling diode; Automotive engineering; Costs; Diodes; Insulation; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Substrates; Thin film circuits; Tunneling; 60GHz; Diodes; MIM devices; detector; millimeter wave; responsivity; sensitivity; thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
ISSN :
1529-2517
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2007.380858
Filename :
4266406
Link To Document :
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