DocumentCode :
2986976
Title :
A Novel Approach to Compute Spatial Reuse in the Design of Custom Instructions
Author :
Pothineni, Nagaraju ; Kumar, Anshul ; Paul, Kolin
Author_Institution :
Indian Inst. of Technol., Delhi
fYear :
2008
fDate :
4-8 Jan. 2008
Firstpage :
348
Lastpage :
353
Abstract :
In the automatic design of custom instruction set processors, there can be a very large set of potential custom instructions, from which a few instructions are required to be chosen, taking into account their spatial as well as temporal reuse and cost. Using the existing pattern matching techniques, finding complete reuse of every identified pattern in the entire application would be very slow and may even be computationally infeasible. Due to this, the existing selection methods employ pattern matching techniques at a very later stage of selection process on a small set of patterns, compromising the quality of selected candidates. In this paper, we propose a method by which each pattern´s reuse information can be derived at an early stage of selection process even when there are very large number of potential patterns. The novel contributions of this paper include a simple and efficient algorithm for finding all the isomorphic convex subgraphs (termed as Recurring Pattern Information(RPI)) of the given application´s Control Data Flow Graph (CDFG). The proposed technique is integrated into the estimation phase of the Instruction Set Extension (ISE) automation. Experimental results show the efficiency of the proposed algorithm and demonstrate its utility in generating high quality custom instructions.
Keywords :
data flow graphs; instruction sets; pattern matching; visual databases; automatic design; control data flow graph; custom instruction set processors; instruction set extension automation; isomorphic convex subgraphs; pattern matching techniques; pattern reuse information; potential custom instructions; recurring pattern information; spatial reuse; Application software; Computer aided instruction; Computer science; Costs; Design engineering; Hardware; Law; Legal factors; Pattern matching; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
ISSN :
1063-9667
Print_ISBN :
0-7695-3083-4
Type :
conf
DOI :
10.1109/VLSI.2008.63
Filename :
4450526
Link To Document :
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