Title :
Fully Depleted SOI RF Switch with Dynamic Biasing
Author :
Chen, C.L. ; Chen, C.K. ; Wyatt, P.W. ; Knecht, J.M. ; Yost, D.-R. ; Gouker, P.M. ; Healey, P.D. ; Keast, C.L.
Author_Institution :
Massachusetts Inst. of Technol., Lexington
Abstract :
RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.
Keywords :
field effect transistor switches; radiofrequency integrated circuits; silicon-on-insulator; MOSFET switch; SPDT; dynamic biasing; fully depleted SOI RF switch; integrated control circuits; silicon-on-insulator; single-pole double-throw switch; Circuit testing; FETs; Insertion loss; MOSFET circuits; Parasitic capacitance; Radio frequency; Resistors; Silicon on insulator technology; Switches; Switching circuits; RF switch; SOI; Si RF integrated circuit; fully depleted SOI; mixed signal;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2007.380859