• DocumentCode
    2987120
  • Title

    An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations

  • Author

    Sedghi, Mahshid ; Koopahi, Elnaz ; Alaghi, Armin ; Fathy, Mahmood ; Navabi, Zainalabedin

  • Author_Institution
    Iran Univ. of Sci. & Technol., Tehran
  • fYear
    2008
  • fDate
    4-8 Jan. 2008
  • Firstpage
    409
  • Lastpage
    414
  • Abstract
    A test strategy for testing NoC switches based on flooding is presented in this paper. This test strategy tests all switch ports and network routes, while it avoids sending a test packet arriving at a switch in every direction. This test strategy is referred to as pseudo-exhaustive, versus the exhaustive testing that sends an incoming test packet of a switch in every direction. As compared with the exhaustive strategy, the pseudo- exhaustive testing consumes lower power consumption, has a lower test time and still has 100% switch port fault coverage. This paper discusses our test strategy, test mode switch hardware requirements, and evaluates test power, time, and coverage.
  • Keywords
    network routing; network-on-chip; NoC test strategy; network routes; network-on-chip switches; pseudo-exhaustive test; switch ports; Built-in self-test; Circuit faults; Circuit testing; Floods; Hardware; Logic testing; Network-on-a-chip; Packet switching; Routing; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2008. VLSID 2008. 21st International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-3083-4
  • Type

    conf

  • DOI
    10.1109/VLSI.2008.111
  • Filename
    4450535