Title :
An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations
Author :
Sedghi, Mahshid ; Koopahi, Elnaz ; Alaghi, Armin ; Fathy, Mahmood ; Navabi, Zainalabedin
Author_Institution :
Iran Univ. of Sci. & Technol., Tehran
Abstract :
A test strategy for testing NoC switches based on flooding is presented in this paper. This test strategy tests all switch ports and network routes, while it avoids sending a test packet arriving at a switch in every direction. This test strategy is referred to as pseudo-exhaustive, versus the exhaustive testing that sends an incoming test packet of a switch in every direction. As compared with the exhaustive strategy, the pseudo- exhaustive testing consumes lower power consumption, has a lower test time and still has 100% switch port fault coverage. This paper discusses our test strategy, test mode switch hardware requirements, and evaluates test power, time, and coverage.
Keywords :
network routing; network-on-chip; NoC test strategy; network routes; network-on-chip switches; pseudo-exhaustive test; switch ports; Built-in self-test; Circuit faults; Circuit testing; Floods; Hardware; Logic testing; Network-on-a-chip; Packet switching; Routing; Switches;
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
Print_ISBN :
0-7695-3083-4
DOI :
10.1109/VLSI.2008.111