• DocumentCode
    2987198
  • Title

    A possible degeneration mechanism in stationary electrical contacts

  • Author

    Timsit, R.S.

  • Author_Institution
    Alcan Int. Ltd., Kingston, Ont., Canada
  • fYear
    1989
  • fDate
    18-20 Sep 1989
  • Firstpage
    201
  • Lastpage
    203
  • Abstract
    A mechanism for the degeneration of stationary electrical contacts is proposed. The mechanism derives from Mullins´ model (1959) of flattening of free surfaces through the action of capillarity forces. Mass transport for surface deformation is assumed to occur through volume self-diffusion and is calculated on the basis of diffusion constants characteristic of plastically deformed or mechanically stressed aluminium. A simple electrical contact model suggests that the increase in contact resistance stemming from surface flattening in Al at room temperature can become noticeable in a time interval of a few days (~106 s). This result may explain the deterioration of contaminated Al/Al stationary electrical contacts operated at room temperature, after run-times of 105-106 s. Finally, since many metals are characterized both by rapid volume or surface diffusion and by a large surface energy, the results suggest that asperity flattening can lead to degeneration in all bulk electrical interfaces
  • Keywords
    aluminium; contact resistance; electrical contacts; failure analysis; materials testing; Al-Al contacts; Mullins´ model; asperity flattening; bulk electrical interfaces; capillarity forces; degeneration mechanism; electrical contact model; flattening of free surfaces; increase in contact resistance; mechanically stressed; plastically deformed; room temperature; stationary electrical contacts; surface deformation; surface diffusion; surface energy; volume self-diffusion; Adhesives; Chemicals; Contacts; Predictive models; Research and development; Shape; Solids; Surface contamination; Surface resistance; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/HOLM.1989.77940
  • Filename
    77940