Title : 
Coded modulation with mismatched power control over block-fading channels
         
        
            Author : 
Kim, Tùng T. ; Guillén i Fàbregas, Albert
         
        
            Author_Institution : 
Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
         
        
        
            fDate : 
June 28 2009-July 3 2009
         
        
        
        
            Abstract : 
Communication over delay-constrained block-fading channels with discrete inputs and imperfect channel state information at the transmitter (CSIT) is studied. The CSIT mismatch is modeled as a Gaussian random variable, whose variance decays as a power of the signal-to-noise ratio (SNR). We focus on the large-SNR behavior of the outage probability when transmit power control is used. We derive the outage exponent as a function of the system parameters, including the CSIT noise variance exponent and the exponent of the peak power constraint. It is shown that CSIT, even if noisy, is always beneficial and leads to significant gains in terms of exponents. It is also shown that when precoders are used at the transmitter, further exponent gains can be attained at the expense of higher decoding complexity.
         
        
            Keywords : 
Gaussian processes; channel coding; communication complexity; decoding; fading channels; modulation; power control; precoding; probability; radio transmitters; random processes; Gaussian random variable; channel state information; coded modulation; decoding complexity; delay-constrained block-fading channels; mismatched power control; outage probability; peak power constraint; precoders; signal-to-noise ratio; transmit power control; transmitter; variance decays; Channel state information; Delay; Fading; Modulation coding; Power control; Power system modeling; Random variables; Receiving antennas; Signal to noise ratio; Transmitters;
         
        
        
        
            Conference_Titel : 
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
         
        
            Conference_Location : 
Seoul
         
        
            Print_ISBN : 
978-1-4244-4312-3
         
        
            Electronic_ISBN : 
978-1-4244-4313-0
         
        
        
            DOI : 
10.1109/ISIT.2009.5205802