DocumentCode
2987413
Title
A Robust Top-Down Dynamic Power Estimation Methodology for Delay Constrained Register Transfer Level Sequential Circuits
Author
Sambamurthy, Sriram ; Abraham, Jacob A. ; Tupuri, Raghuram S.
Author_Institution
Univ. of Texas at Austin, Austin
fYear
2008
fDate
4-8 Jan. 2008
Firstpage
521
Lastpage
526
Abstract
We present a top-down dynamic power estimation methodology for delay constrained sequential circuits. The methodology works at the register transfer level (RT-Level), and applies to both structural and behavioral descriptions of circuits. The average power consumption of a circuit varies with the worst case cycle-time or frequency of operation. As the cycle-time is reduced, the increase in the capacitance of the circuit due to technology mapping and optimization is captured by our technique at the RT-Level using the principles of logical effort. Switching activity is obtained at the RT-Level visible nodes through RT-Level functional simulation. This information is utilized to approximate the activities at the remaining nodes of the circuit and combined with capacitance to estimate dynamic power. Power estimation results for RT-Level sequential circuits indicate good accuracy (average error<10%) with respect to the reference values obtained by detailed gate-level power analysis. The power consumed by a circuit varies with the target library and technology. Our methodology is parameterizable and the results obtained for different target libraries at 0.18 mum TSMC and 0.13 mum UMC technologies are consistent, indicating the robustness of our technique. The applicability of our methodology in design frameworks consisting of bottom-up techniques is also discussed.
Keywords
VLSI; capacitance; circuit optimisation; circuit simulation; delays; logic design; low-power electronics; sequential circuits; RT-Level functional simulation; TSMC technologies; UMC technologies; bottom-up techniques; circuit capacitance; delay constrained register transfer level sequential circuits; design methodology; gate-level power analysis; power consumption; size 0.13 mum; size 0.18 mum; switching activity; top-down dynamic power estimation methodology; Capacitance; Circuit simulation; Computer errors; Delay estimation; Energy consumption; Frequency; Libraries; Registers; Robustness; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location
Hyderabad
ISSN
1063-9667
Print_ISBN
0-7695-3083-4
Type
conf
DOI
10.1109/VLSI.2008.56
Filename
4450552
Link To Document