Title :
On the sensitivity of noncoherent capacity to the channel model
Author :
Durisi, Giuseppe ; Morgenshtern, Veniamin I. ; Bölcskei, Helmut
Author_Institution :
Commun. Technol. Lab., ETH Zurich, Zurich, Switzerland
fDate :
June 28 2009-July 3 2009
Abstract :
The noncoherent capacity of stationary discrete-time fading channels is known to be very sensitive to the fine details of the channel model. More specifically, the measure of the set of harmonics where the power spectral density of the fading process is nonzero determines if capacity grows logarithmically in SNR or slower than logarithmically. An engineering-relevant problem is to characterize the SNR value at which this sensitivity starts to matter. In this paper, we consider the general class of continuous-time Rayleigh-fading channels that satisfy the wide-sense stationary uncorrelated-scattering (WSSUS) assumption and are, in addition, underspread. For this class of channels, we show that the noncoherent capacity is close to the AWGN capacity for all SNR values of practical interest, independently of whether the scattering function is compactly supported or not. As a byproduct of our analysis, we obtain an information-theoretic pulse-design criterion for orthogonal frequency-division multiplexing systems.
Keywords :
AWGN channels; OFDM modulation; Rayleigh channels; continuous time systems; discrete time systems; information theory; AWGN capacity; SNR; channel model; continuous-time Rayleigh-fading channels; fading process; information-theoretic pulse-design criterion; noncoherent capacity; orthogonal frequency-division multiplexing systems; power spectral density; stationary discrete-time fading channels; wide-sense stationary uncorrelated-scattering; AWGN; Channel capacity; Density measurement; Fading; Information analysis; Power engineering and energy; Power measurement; Power system harmonics; Rayleigh channels; Rayleigh scattering;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5205806