DocumentCode :
2987592
Title :
Behavioral Modeling of a CMOS Compatible High Precision MEMS Based Electron Tunneling Accelerometer
Author :
Bhattacharyya, T.K. ; Ghosh, Anandaroop
Author_Institution :
Indian Inst. of Technol., Kharagpur
fYear :
2008
fDate :
4-8 Jan. 2008
Firstpage :
595
Lastpage :
600
Abstract :
The paper presents a comprehensive behavioral model of a high precision tunneling accelerometer. Design and optimization of the silicon based tunneling has also been reported in this work. The accelerometer is CMOS compatible and has actuation voltage within CMOS bias levels. The proposed structure uniquely combines the electron tunneling based sensing and capacitive actuation. A feedback controller is designed to measure the acceleration under constant gap mode of operation. The full dynamic range of operation is 1 mug to 200 mug with a resolution in the order of nano-g. The cross-axis sensitivity is less than 1% and the shock survivability is 10 g for a 10 ms shock with 0.1 ms rise time. The Brownian noise floor of the system has also been studied and the squeeze film damping effects on the system has been shown.
Keywords :
CMOS integrated circuits; accelerometers; damping; electrostatic actuators; feedback; integrated circuit modelling; microsensors; tunnelling; Brownian noise floor; CMOS bias levels; CMOS compatible high precision MEMS; acceleration measurement; actuation voltage; capacitive actuation; constant gap mode operation; cross-axis sensitivity; electron tunneling accelerometer behavioral modeling; electron tunneling based sensing; feedback controller design; shock survivability; silicon based tunneling; squeeze film damping effects; Accelerometers; Adaptive control; Design optimization; Electric shock; Electrons; Micromechanical devices; Semiconductor device modeling; Silicon; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
ISSN :
1063-9667
Print_ISBN :
0-7695-3083-4
Type :
conf
DOI :
10.1109/VLSI.2008.60
Filename :
4450563
Link To Document :
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