DocumentCode
2987617
Title
Automated classification of power quality disturbances using the S-transform
Author
Zhang, Ming ; Li, Kai-cheng ; Hu, Wei-bing
Author_Institution
Electr. Power Security & High Efficiency Lab., Huazhong Univ. of Sci. & Technol., Wuhan
Volume
1
fYear
2008
fDate
30-31 Aug. 2008
Firstpage
321
Lastpage
326
Abstract
With the wide application of sensitive power electronic devices in industry, the power quality (PQ) disturbance problems become more concerned. The S-transform is a time-frequency localization technique that bridges the gap between the short-time Fourier transform and wavelet transform. A new PQ disturbances identification method based on S-transform time-frequency analysis and fuzzy expert system is proposed in this paper. Through S-transform time-frequency analysis, a set of feature components are extracted for identification of PQ disturbances. The fuzzy expert system is also used to identify PQ disturbances. Finally, the paper shows the simulation results which present that the proposed method possesses high identification rate and strong rejection to noises, so it is suitable for monitoring and classification of PQ disturbances.
Keywords
Fourier transforms; expert systems; feature extraction; fuzzy reasoning; pattern classification; power supply quality; power system analysis computing; power system faults; power system measurement; time-frequency analysis; wavelet transforms; PQ disturbance monitoring; S-transform; automated power quality disturbance classification; feature component extraction; fuzzy expert system; fuzzy inference engine; sensitive power electronic device; short-time Fourier transform; time-frequency analysis; time-frequency localization technique; wavelet transform; Bridges; Electronics industry; Feature extraction; Fourier transforms; Hybrid intelligent systems; Monitoring; Power electronics; Power quality; Time frequency analysis; Wavelet transforms; Classification; Fuzzy expert system; Power quality disturbances; S-transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-2238-8
Electronic_ISBN
978-1-4244-2239-5
Type
conf
DOI
10.1109/ICWAPR.2008.4635797
Filename
4635797
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