Title :
On-Chip Circuit for Measuring Data Jitter in the Time or Frequency Domain
Author :
Ishida, Masahiro ; Ichiyama, Kiyotaka ; Yamaguchi, Takahiro J. ; Soma, Mani ; Suda, Masakatsu ; Okayasu, Toshiyuki
Author_Institution :
Advantest Lab., Ltd., Sendai
Abstract :
An on-chip data jitter measurement circuit in 0.11-mum CMOS is demonstrated. It utilizes a data-to-clock converter, pulse generators, and an integrator followed by a sample-&-hold. The circuit outputs a data jitter waveform in real-time, and doesn´t require a reference clock. Its measurement linearity is 11 muV/ps with an error of 1.56 psRMS for a 2.5 Gbps 7-stage PRBS.
Keywords :
CMOS integrated circuits; clocks; data conversion; integrated circuit measurement; pulse generators; reference circuits; sample and hold circuits; timing jitter; CMOS; PRBS; data jitter waveform; data-to-clock converter; frequency domain; integrator; measurement linearity; on-chip circuit; on-chip data jitter measurement circuit; pulse generators; reference clock; sample-&-hold; time domain; Clocks; Counting circuits; Data mining; Frequency domain analysis; Frequency measurement; Histograms; Integrated circuit measurements; Semiconductor device measurement; Time measurement; Timing jitter; CMOS integrated circuit; data jitter; data jitter spectrum; jitter; spectral estimation; time domain measurement; timing jitter;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2007.380898
