On-Chip Circuit for Measuring Data Jitter in the Time or Frequency Domain

Author

Ishida, Masahiro ; Ichiyama, Kiyotaka ; Yamaguchi, Takahiro J. ; Soma, Mani ; Suda, Masakatsu ; Okayasu, Toshiyuki

Author_Institution

Advantest Lab., Ltd., Sendai

fYear

2007

fDate

3-5 June 2007

Firstpage

347

Lastpage

350

Abstract

An on-chip data jitter measurement circuit in 0.11-mum CMOS is demonstrated. It utilizes a data-to-clock converter, pulse generators, and an integrator followed by a sample-&-hold. The circuit outputs a data jitter waveform in real-time, and doesn´t require a reference clock. Its measurement linearity is 11 muV/ps with an error of 1.56 ps_RMS for a 2.5 Gbps 7-stage PRBS.

Keywords

CMOS integrated circuits; clocks; data conversion; integrated circuit measurement; pulse generators; reference circuits; sample and hold circuits; timing jitter; CMOS; PRBS; data jitter waveform; data-to-clock converter; frequency domain; integrator; measurement linearity; on-chip circuit; on-chip data jitter measurement circuit; pulse generators; reference clock; sample-&-hold; time domain; Clocks; Counting circuits; Data mining; Frequency domain analysis; Frequency measurement; Histograms; Integrated circuit measurements; Semiconductor device measurement; Time measurement; Timing jitter; CMOS integrated circuit; data jitter; data jitter spectrum; jitter; spectral estimation; time domain measurement; timing jitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE

Conference_Location

Honolulu, HI

ISSN

1529-2517

Print_ISBN

1-4244-0530-0

Electronic_ISBN

1529-2517

Type

conf

DOI

10.1109/RFIC.2007.380898

Filename

4266446