DocumentCode :
2987633
Title :
0.35µ, 1 GHz, CMOS Timing Generator Using Array of Digital Delay Lock Loops
Author :
Balaji, S. ; Chandratre, V.B. ; Tewani, Menka
Author_Institution :
Cognizant Technol. Solutions, Chennai
fYear :
2008
fDate :
4-8 Jan. 2008
Firstpage :
613
Lastpage :
619
Abstract :
This paper describes the architecture and performance of a 0.35 mu, 1 GHZ, CMOS timing generator using array of delay lock loop. The timing generator is implemented as an array of delay locked loops. This architecture enables a timing generator with sub gate delay resolution to be implemented. The proposed delay lock loops uses novel multiplexer based dual phase and frequency detector along with a charge pump where the injected charge approaches zero as the loop approaches lock on the leading edge and the trailing edge of an input clock reference. This greatly reduces the timing jitter, loop locks to both the leading and trailing clock edges as the dual phase and frequency detector along with charge pump converts the phase difference in to voltages. Test results show a timing jitter of less than 20 pS for the DLL (delay lock loop) circuit .The DLL has a dead zone less than 0.01 nS in the phase characteristics and has low phase sensitivity errors. The timing generator is implemented as an array of delay locked loops (Kostamovaara, 2000) which exponentially reduce the locking time. An experimental proto type was simulated at 0.7 mu and 0.35 mu technologies with a supply voltage of 5 V and 3.3 V respectively.
Keywords :
CMOS digital integrated circuits; clocks; delay lock loops; phase detectors; timing circuits; timing jitter; CMOS timing generator; DLL circuit; charge pump; digital delay lock loops; frequency 1 GHz; frequency detector; input clock reference; leading clock edges; multiplexer based dual phase detector; size 0.35 mum; sub gate delay resolution; timing jitter; trailing clock edges; voltage 3.3 V; voltage 5 V; Charge pumps; Circuit testing; Clocks; Delay; Multiplexing; Phase detection; Phase frequency detector; Timing jitter; Tracking loops; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
ISSN :
1063-9667
Print_ISBN :
0-7695-3083-4
Type :
conf
DOI :
10.1109/VLSI.2008.95
Filename :
4450566
Link To Document :
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