DocumentCode :
2987732
Title :
Measurement system for the high-throughput characterization of metal nanoparticles for biosensors
Author :
Curry, Adam ; Nusz, Greg ; Chilkoti, Ashutosh ; Wax, Adam
Author_Institution :
Dept. of Biomed. Eng., Duke Univ., Durham, NC, USA
Volume :
3
fYear :
2005
fDate :
22-27 May 2005
Firstpage :
2160
Abstract :
We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography.
Keywords :
atomic force microscopy; biosensors; electron beam lithography; nanoparticles; nanotechnology; atomic force microscopy; biosensors; electron beam lithography; metal nanoparticles; scattering spectra; Atomic beams; Atomic force microscopy; Atomic measurements; Biosensors; Electron beams; Electron microscopy; Lithography; Nanoparticles; Nanostructures; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
Type :
conf
DOI :
10.1109/CLEO.2005.202402
Filename :
1573468
Link To Document :
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