DocumentCode
2987732
Title
Measurement system for the high-throughput characterization of metal nanoparticles for biosensors
Author
Curry, Adam ; Nusz, Greg ; Chilkoti, Ashutosh ; Wax, Adam
Author_Institution
Dept. of Biomed. Eng., Duke Univ., Durham, NC, USA
Volume
3
fYear
2005
fDate
22-27 May 2005
Firstpage
2160
Abstract
We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography.
Keywords
atomic force microscopy; biosensors; electron beam lithography; nanoparticles; nanotechnology; atomic force microscopy; biosensors; electron beam lithography; metal nanoparticles; scattering spectra; Atomic beams; Atomic force microscopy; Atomic measurements; Biosensors; Electron beams; Electron microscopy; Lithography; Nanoparticles; Nanostructures; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN
1-55752-795-4
Type
conf
DOI
10.1109/CLEO.2005.202402
Filename
1573468
Link To Document