Title :
Results of long term testing of tactical miniature crystal oscillators
Author :
Messina, J. ; Bowman, D. ; Filler, R. ; Lindenmuth, R. ; Rosati, V. ; Schodowski, S.
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA
fDate :
31 May-2 Jun 1989
Abstract :
The results of long-term testing of the tactical miniature crystal oscillator (TMXO) are presented. The TMXO uses high-vacuum thermal insulation, microelectronic packaging, and a precision ceramic-flatpack-enclosed SC-cut crystal. Engineering models and pilot-production models, delivered under a Manufacturing Methods and Technology effort with the Bendix Division of Allied Corporation, were subjected to a variety of tests that included turn-on/turn-off at temperature extremes, input-power aging, and frequency aging. The testing verified the ability of the TMXO to maintain vacuum integrity over a reasonable lifetime (10 years)
Keywords :
circuit reliability; crystal resonators; electronic equipment testing; life testing; packaging; radiofrequency oscillators; 10 MHz; Allied Corporation; Bendix Division; RF type; SC-cut crystal; ceramic flatpack enclosed crystal; engineering models; frequency aging; high-vacuum thermal insulation; input-power aging; long term testing; microelectronic packaging; pilot-production models; tactical miniature crystal oscillators; turn-on/turn-off; vacuum integrity; Aging; Frequency conversion; Insulation; Maintenance engineering; Microelectronics; Oscillators; Packaging; Temperature; Testing; Virtual manufacturing;
Conference_Titel :
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/FREQ.1989.68833
