Title :
A statistical framework for dimensionality reduction implementation in FPGAs
Author :
Bouganis, Christos-S ; Pournara, Iosifina ; Cheung, Peter Y K
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. London
Abstract :
Dimensionality reduction or feature extraction has been widely used in applications that require a set of data to be represented by a small set of variables. A linear projection is often chosen due to its computational attractiveness. The calculation of the linear basis that best explains the data is usually addressed using the Karhunen-Loeve transform (KLT). Moreover, for applications where real-time performance and flexibility to accommodate new data are required, the linear projection is implemented in FPGAs due to their fine-grain parallelism and reconfigurability properties. Currently, the optimization of such a design in terms of area usage is considered as a separate problem to the basis calculation. In this paper, we propose a novel approach that couples the calculation of the linear projection basis and the area optimization problems under a probabilistic Bayesian framework. The power of the proposed framework is based on the flexibility to insert information regarding the implementation requirements of the linear basis by assigning a proper prior distribution. Results using real-life examples demonstrate the effectiveness of our approach
Keywords :
Bayes methods; field programmable gate arrays; logic design; microprocessor chips; FPGA; Karhunen-Loeve transform; dimensionality reduction; feature extraction; fine-grain parallelism; linear projection; probabilistic Bayesian framework; reconfigurability properties; statistical framework; Bayesian methods; Data engineering; Design optimization; Educational institutions; Face detection; Feature extraction; Field programmable gate arrays; Hardware; Karhunen-Loeve transforms; Parallel processing;
Conference_Titel :
Field Programmable Technology, 2006. FPT 2006. IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
0-7803-9729-0
Electronic_ISBN :
0-7803-9729-0
DOI :
10.1109/FPT.2006.270349