• DocumentCode
    2988124
  • Title

    A field theoretic approach to the analysis of practical coupled dielectric resonators

  • Author

    Sarkar, T.K. ; Chaowei Su ; Djordjevic, A.R. ; Kolundzija, B. ; Salazar-Palma, M. ; Caceras, J.L.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    13-19 June 1999
  • Firstpage
    167
  • Abstract
    Conventional methods for the analysis of dielectric resonators utilize the mode-matching technique. Other methods have also been used. However, most of the analysis exists for analysis of single resonators. However, for practical dielectric resonators (when more than one loaded cavity is used) there may be apertures coupling one resonator to the other. In addition there may be probes coupling one resonator to the other to carry out response shaping or even cancel out the effects of the higher order modes. Also, probes may be utilized to couple energy into and out of the resonators. The high dielectric constant resonator is generally placed on top of a low dielectric constant material for support. Hence an effective analysis modeling is necessary which will predict the actual experimental data accurately if the appropriate material properties are correctly specified for coupled multiple dielectric resonators. This includes analysis of dielectric resonators with aperture couplings along with probe feeds.
  • Keywords
    cavity resonators; coupled circuits; dielectric resonators; permittivity; aperture couplings; coupled dielectric resonators; dielectric constant; field theoretic approach; higher order modes; loaded cavity; material properties; probe feeds; response shaping; Apertures; Chaos; Computer science; Connectors; Coupled mode analysis; Dielectric constant; Dielectric materials; High-K gate dielectrics; Magnetic materials; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1999 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5135-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1999.779449
  • Filename
    779449