DocumentCode
2988133
Title
The influence of circuit parameters and contact materials on the reignition of high frequency vacuum arcs
Author
Lindmayer, M. ; Wilkening, Ernst-Dieter
Author_Institution
Inst. fuer Electr. Energieanlagen, Tech. Univ. Braunschweig, West Germany
fYear
1989
fDate
18-20 Sep 1989
Firstpage
237
Lastpage
243
Abstract
The extinction or reignition of high-frequency transients plays an important role in the generation of voltage surges. Investigations with currents of several hundred amperes peak and current frequencies from 100 kHz up to 1 MHz were made to examine the reignition behavior of short vacuum gaps using different contact materials. The experiments were carried out in an UHV (ultrahigh vacuum) test chamber connected to an LC test circuit with voltages in the 10-kV range. The statistical distribution of the reignition voltage after current zero of HF vacuum arcs yields two probable reignition mechanisms, the cold gap behavior and the plasma-influenced reignition. The reignition tendency increases with rising di /dt and rising current frequency. The reignition voltages of the examined contact materials increase in the sequence: OFHC Cu, Cr, Cu/Cr 75/25
Keywords
chromium; chromium alloys; circuit-breaking arcs; copper; copper alloys; electrical contacts; 10 kV; 100 to 1000 kHz; Cr; Cu; CuCr; HF vacuum arcs; LC test circuit; OFHC; UHV; circuit parameters; cold gap behavior; contact materials; current frequencies; currents of several hundred amperes peak; generation of voltage surges; high-frequency transients; plasma-influenced reignition; reignition behavior; reignition mechanisms; reignition of high frequency vacuum arcs; reignition voltage; short vacuum gaps; statistical distribution; ultrahigh vacuum; Circuit breakers; Circuit testing; Coupling circuits; Dielectric materials; Equations; Frequency; Hafnium; Mutual coupling; Vacuum arcs; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
Conference_Location
Chicago, IL
Type
conf
DOI
10.1109/HOLM.1989.77945
Filename
77945
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