• DocumentCode
    2988142
  • Title

    Wavelet SVM ensemble for pattern classification with quantum-inspired evolutionary algorithm

  • Author

    Luo, Zhi-Yong ; Zhang, Wen-feng ; Ye, Bin-yuan ; Cai, Lin-Qin

  • Author_Institution
    Coll. of Autom., Chongqing Univ. of Posts & Telecommun., Chongqing
  • Volume
    2
  • fYear
    2008
  • fDate
    30-31 Aug. 2008
  • Firstpage
    485
  • Lastpage
    490
  • Abstract
    Based on quantum-inspired evolutionary algorithm (QEA), a novel approach of constructing multi-class least squares wavelet SVM (LS-WSVM) ensemble classifiers is presented, regularization parameters and kernel parameters of LS-WSVM can be optimized. Quantum-inspired evolutionary optimization can get appropriate parameters of LS-WSVM with global search, so the LS-WSVM ensemble model with boosting for the multi-class classifiers is built. And then, classification is studied using single base LS-SVM and LS-SVM ensemble with wavelet and Gaussian kernel, respectively. The simulation results show that the approach for the multi-class LS-WSVM ensemble classifiers is effective, that can obtain the optimal parameters of LS-WSVM with global searching QEA, and improved LS-WSVM provides excellent precision for ensemble classification.
  • Keywords
    Gaussian processes; evolutionary computation; least squares approximations; pattern classification; support vector machines; wavelet transforms; Gaussian kernel; multi-class least squares wavelet SVM; pattern classification; quantum-inspired evolutionary algorithm; wavelet SVM ensemble; Educational institutions; Evolutionary computation; Kernel; Least squares methods; Pattern analysis; Pattern classification; Pattern recognition; Support vector machine classification; Support vector machines; Wavelet analysis; LS-WSVM ensemble classifiers; Least squares wavelet support vector machine (LS-WSVM); Parameter optimization; Quantum-inspired evolutionary algorithm (QEA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2238-8
  • Electronic_ISBN
    978-1-4244-2239-5
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2008.4635829
  • Filename
    4635829