Title : 
Nonlinear Behavioral Modeling of Passive RFID-Transponder-Frontends
         
        
            Author : 
Seemann, Kay ; Hartmann, Marcus ; Cilek, Fatih ; Missoni, Albert ; Holweg, Gerald ; Weigel, Robert
         
        
            Author_Institution : 
Univ. of Erlangen-Nuremberg, Erlangen
         
        
        
        
        
        
            Abstract : 
A nonlinear RFID frontend behavioral model has been developed. By using this model the simulation time for inlay optimizations can be decreased considerably and the models hide the IC manufacturer´s intellectual properties. The inherent model order reduction is based on nonlinear state-space mapping using derivative coordinates and harmonic-balance simulations. Feedforward multi-layer-perceptron artificial-neural-networks have been used for the nonlinear multivariate system mapping. The behavioral modeling of RF power rectification, RF voltage limiting and backscatter modulation is demonstrated for a modern passive UHF-RFID CMOS frontend.
         
        
            Keywords : 
UHF integrated circuits; integrated circuit modelling; neural nets; radiofrequency identification; state-space methods; transponders; IC manufacturer; RF power rectification; RF voltage limiting; artificial-neural-networks; backscatter modulation; derivative coordinates; feedforward multilayer-perceptron; harmonic-balance simulations; inlay optimizations; intellectual properties; model order reduction; modern passive UHF-RFID CMOS frontend; nonlinear RFID frontend behavioral model; nonlinear behavioral modeling; nonlinear multivariate system mapping; nonlinear state-space mapping; passive RFID-transponder-frontends; Artificial neural networks; Backscatter; Integrated circuit modeling; Intellectual property; Power system modeling; Radio frequency; Radiofrequency identification; Semiconductor device modeling; Virtual manufacturing; Voltage;
         
        
        
        
            Conference_Titel : 
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
         
        
            Conference_Location : 
Honolulu, HI
         
        
        
            Print_ISBN : 
1-4244-0530-0
         
        
            Electronic_ISBN : 
1529-2517
         
        
        
            DOI : 
10.1109/RFIC.2007.380928