• DocumentCode
    2988302
  • Title

    Performance and Yield Optimization of mm-Wave PLL Front-End in 65nm SOI CMOS

  • Author

    Lim, Daihyun ; Kim, Jonghae ; Plouchart, Jean-Olivier ; Kim, Daeik ; Cho, Choongyeun ; Boning, Duane S.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge
  • fYear
    2007
  • fDate
    3-5 June 2007
  • Firstpage
    525
  • Lastpage
    528
  • Abstract
    A combination of LC-VCO and 2:1 CML static frequency divider has been fabricated in 65 nm SOI CMOS technology and operates at 70 GHz. A cascoded buffer amplifier is used in VCO-to-divider connection to compensate for the power losses caused by interconnect parasitics, and inductive peaking is employed for bandwidth enhancement. The bias condition of the frequency divider has been tuned to find an optimal bias point in existence of VCO and frequency divider operating range variation. The inter-die variation of VCO and divider performance variations over a wafer and their correlation have been estimated.
  • Keywords
    CMOS integrated circuits; circuit optimisation; circuit tuning; compensation; current-mode logic; frequency dividers; integrated circuit yield; millimetre wave amplifiers; millimetre wave integrated circuits; millimetre wave oscillators; phase locked loops; voltage-controlled oscillators; CML static frequency divider; LC-VCO; SOI CMOS; bandwidth enhancement; bias condition tuning; cascoded buffer amplifier; frequency 70 GHz; inductive peaking; inter-die variation; interconnect parasitics; mm-wave PLL front-end; power loss compensation; size 65 nm; yield optimization; CMOS process; CMOS technology; Frequency conversion; Integrated circuit interconnections; Millimeter wave technology; Parasitic capacitance; Phase locked loops; Tuning; Varactors; Voltage-controlled oscillators; Process variation; VCO; frequency divider; inductive peaking; mm wave CMOS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1529-2517
  • Print_ISBN
    1-4244-0530-0
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2007.380938
  • Filename
    4266486