Title :
Ka-Band Low-Loss and High-Isolation 0.13 μm CMOS SPST/SPDT Switches Using High Substrate Resistance
Author :
Min, Byung-Wook ; Rebeiz, Gabriel M.
Author_Institution :
Michigan Univ., Ann Arbor
Abstract :
This paper presents 35 GHz single-pole-single-throw (SPST) and single-pole-double-throw (SPDT) CMOS switches using a 0.13 mum BiCMOS process (IBM 8 HP). The CMOS transistors are designed to have a high substrate resistance to minimize the insertion loss and improve power handling capability. The SPST/SPDT switches have a insertion loss of 1.8 dB/2.2 dB, respectively, and an input 1-dB compression point (P1 dB) greater than 22 dBm. The isolation is greater than 30 dB at 35-40 GHz and is achieved using two parallel resonant networks. To our knowledge, this is the first demonstration of low-loss, high-isolation CMOS switches at Ka-band frequencies.
Keywords :
BiCMOS analogue integrated circuits; CMOS analogue integrated circuits; contact resistance; field effect MIMIC; field effect MMIC; integrated circuit design; microwave switches; millimetre wave devices; BiCMOS process; CMOS transistor design; Ka-band low-loss CMOS switches; RFIC; frequency 35 GHz to 40 GHz; high substrate resistance; insertion loss reduction; microwave switch; parallel resonant networks; power handling capability; single-pole-double-throw switches; single-pole-single-throw switches; size 0.13 mum; CMOS process; Contact resistance; Immune system; Insertion loss; MOS devices; MOSFETs; Power semiconductor switches; Roentgenium; Substrates; Switching circuits; CMOS switch; Ka-band; RFIC; SPDT; SPST; T/R switch; microwave switch; substrate resistance;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2007.380948