DocumentCode :
2989172
Title :
Choquet integral logistic regression algorithm based on L-mesure and γ-support
Author :
Liu, Hsiang-chuan ; Jheng, Yu-Du ; Chen, Guey-Shya ; Jeng, Bai-cheng
Author_Institution :
Dept. of Bioinf., Asia Univ. Taiwan, Taichung
Volume :
2
fYear :
2008
fDate :
30-31 Aug. 2008
Firstpage :
771
Lastpage :
776
Abstract :
Logistic regression algorithm and SVM algorithm are two well-known classification algorithms but when the multi-collinearity between independent variables occurs in above two algorithms, their classifying performance will always be not good. An improved classification algorithm combining the Choquet integral with respect to the lambda-measure based on gamma-support is proposed by our previous work. In this paper, we replaced the more sensitive fuzzy measure, L-measure with the lambda-measure in above improved classification algorithm, and we obtained a further improved algorithm, called Choquet integral logistic regression algorithm based on L-measure and gamma-support. For evaluating the performances of the SVM, logistic regression and the Choquet integral logistic regression algorithm with gamma-support based on P-measure, lambda-measure and L-measure, respectively, a real data experiment by using leave-one-out cross-validation accuracy is conducted. Experimental result shows that our new algorithm has the best performance.
Keywords :
fuzzy set theory; pattern classification; regression analysis; transforms; Choquet integral logistic regression algorithm; classification algorithms; leave-one-out cross-validation; support vector machines; Algorithm design and analysis; Classification algorithms; Logistics; Pattern analysis; Pattern recognition; Performance analysis; Performance evaluation; Support vector machine classification; Support vector machines; Wavelet analysis; γ-support; λ-measure; Fuzzy measure; L-measure; hoquet integral;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2238-8
Electronic_ISBN :
978-1-4244-2239-5
Type :
conf
DOI :
10.1109/ICWAPR.2008.4635881
Filename :
4635881
Link To Document :
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