• DocumentCode
    2989361
  • Title

    A static CMOS master-slave flip-flop experiment

  • Author

    Vesterbacka, Mark

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Sweden
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    870
  • Abstract
    A variant of a classical master-slave flip-flop based on transmission gates is derived where the transmission gates are replaced by static CMOS gates. The transmission gate flip-flop and the variant are evaluated along with one flip-flop based on C2MOS latches and another based on SR latches. All flip-flops are edge-triggered. The propagation delay, set-up time, and hold time are estimated using a 0.35 μm process. The author also investigates how the power dissipation at the maximal clock frequency varies when the supply voltage is scaled, both when the device geometry is kept constant and when it is scaled to yield good noise margins. In comparison, the variant on master-slave flip-flop has short propagation delay, but is only average in terms of throughput and power consumption. The flip-flop realized with C2 MOS latches seems to be a better candidate for a general-purpose implementation when voltage scaling is an option
  • Keywords
    CMOS logic circuits; delay estimation; flip-flops; integrated circuit noise; 0.35 micron; C2MOS latches; SR latches; constant device geometry; device geometry scaling; edge-triggered flip-flops; general-purpose implementation; hold time estimation; master-slave flip-flop experiment; maximal clock frequency; noise margins; power dissipation; propagation delay estimation; set-up time estimation; static CMOS flip-flop; supply voltage scaling; throughput; transmission gates; Clocks; Delay estimation; Flip-flops; Frequency; Geometry; Master-slave; Power dissipation; Propagation delay; Strontium; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2000. ICECS 2000. The 7th IEEE International Conference on
  • Conference_Location
    Jounieh
  • Print_ISBN
    0-7803-6542-9
  • Type

    conf

  • DOI
    10.1109/ICECS.2000.913014
  • Filename
    913014