• DocumentCode
    2989759
  • Title

    Simulation of a Novel Lateral H Structure PIN InGaAs Photodiode with Consistent Electron Drift Length

  • Author

    Hong, E.L.C. ; Shaari, Sahbudin

  • Author_Institution
    Univ. Kebangsaan Malaysia, Bangi
  • fYear
    2006
  • fDate
    Oct. 29 2006-Dec. 1 2006
  • Firstpage
    52
  • Lastpage
    57
  • Abstract
    We investigated the microscopic view of electron captured in a lateral PIN InGaAs photodiodes which was implemented on an H electrode structure. The results illustrated a near ideal generated current with minimal delay time. We assumed the structure was implemented in a 10 Gbps, 30 Gbs and 50 Gbps network with a PIN sensitivity of 30 dBm with incident light power at 0.1 mW. The sizes of the electrodes range from 7 mum to 8 mum at 0.8 and 0.5 intrinsic-junction ratio respectively. The fastest response 1,210,900,945 A/W of the device was obtained through a simulator study.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; p-i-n photodiodes; semiconductor device models; H-Gen; InGaAs; PIN sensitivity; bit rate 10 Gbit/s; bit rate 30 Gbit/s; bit rate 50 Gbit/s; electron drift length; intrinsic-junction ratio; lateral H structure PIN photodiode; power 0.1 mW; size 7 mum to 8 mum; Bandwidth; Delay effects; Electrodes; Electron microscopy; Fingers; Indium gallium arsenide; Mathematical model; Nanoelectronics; PIN photodiodes; Photodetectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    0-7803-9730-4
  • Electronic_ISBN
    0-7803-9731-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2006.381018
  • Filename
    4266568