Title :
On the use of a Mixed-Mode Approach For MEMS Testing
Author :
Islam, Md Fokhrul ; Ali, M. A Mohd
Author_Institution :
Univ. Kebangsaan Malaysia, Bangi
fDate :
Oct. 29 2006-Dec. 1 2006
Abstract :
In the testing environment, test patterns are generated using techniques such as exhaustive, pseudo-random, deterministic and weighted random testing. Using deterministic testing technique, huge amount of memory space and lengthy testing time are required to generate and store large number of test patterns. On the other hand, pseudo-random technique reduces the number of test patterns but cannot achieve complete fault coverage. Hence primitive polynomial linear feedback shift register (LFSR) based pseudo-random and deterministic techniques have recently been proposed to be used simultaneously. This has been referred to as the mixed-mode approach. This paper introduces the adaptation of the mixed-mode test technique for MEMS testing.
Keywords :
circuit testing; micromechanical devices; radiofrequency filters; shift registers; MEMS testing; RF MEMS filter; deterministic testing; exhaustive testing; mixed-mode approach; primitive polynomial linear feedback shift register; pseudorandom testing; test pattern generation; weighted random testing; Autocorrelation; Circuit testing; Electronic equipment testing; Impulse testing; Life testing; Micromechanical devices; Signal processing; System testing; Systems engineering and theory; Test pattern generators;
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
DOI :
10.1109/SMELEC.2006.381020