Title : 
Fault Detection, Isolation, and Localization in Embedded Control Software
         
        
        
            Author_Institution : 
Iowa State Univ., Ames, IA
         
        
        
        
        
        
            Abstract : 
Embedded control software reacts to plant and environment conditions in order to enforce a desired functionality, and exhibit hybrid dynamics: control-loops together with switching logic. Control software can contain errors (faults), and fault-tolerance methods must be developed to enhance system safety and reliability. We present an approach for fault detection and isolation that is key to achieving fault-tolerance. Detection approach is hierarchical involving monitoring both the control software, and the controlled-system. The latter is necessary to safeguard against any incompleteness of software level properties. A model of the system being monitored is not required, and further the approach is modular and hence scalable. When fault is detected at the system level, an isolation of a software fault is achieved by using residue methods to rule out any hardware (plant) fault. We also proposed a method to localize a software fault (to those lines of code that contain the fault). The talk will be illustrated through a servo control application.
         
        
            Keywords : 
control engineering computing; fault diagnosis; software fault tolerance; embedded control software; fault detection; fault isolation; fault localization; fault-tolerance method; residue method; switching logic; system reliability; system safety; Control systems; Embedded software; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Logic; Monitoring; Software safety;
         
        
        
        
            Conference_Titel : 
Intelligent Control, 2008. ISIC 2008. IEEE International Symposium on
         
        
            Conference_Location : 
San Antonio, TX
         
        
        
            Print_ISBN : 
978-1-4244-2224-1
         
        
            Electronic_ISBN : 
2158-9860
         
        
        
            DOI : 
10.1109/ISIC.2008.4635929