Title :
Degradation of Single Layer MEH-PPV Organic Light Emitting Diode (OLED)
Author :
Juhari, Nurjuliana ; Majid, Wan Haliza Abd ; Ibrahim, Zainol Abidin
Author_Institution :
Kolej Univ. Kejuruteraan Utara Malaysia (KUKUM), Jejawi
fDate :
Oct. 29 2006-Dec. 1 2006
Abstract :
The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it.
Keywords :
electroluminescence; organic light emitting diodes; scanning electron microscopy; EL; OLED; SEM images; electroluminescence; organic light emitting diode; scanning electron microscope; Electroluminescence; Fabrication; Indium tin oxide; Optical films; Optical polymers; Organic light emitting diodes; Oxidation; Polymer films; Scanning electron microscopy; Thermal degradation;
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
DOI :
10.1109/SMELEC.2006.381030
