Title :
System level testing of analog functions in a mixed-signal circuit
Author :
Al-Qutayri, Mahmoud A.
Author_Institution :
Etisalat Coll. of Eng., Emirates Telecommun. Corp., Sharjah, United Arab Emirates
Abstract :
This paper outlines the problems of testing analog circuits in general and those in a mixed-signal integrated circuit in particular. It proposes a system level testing technique based on the excitation of the circuit-under-test with a pseudo-random binary sequence and subsequent estimation of its impulse response. The fault detection capability of the test and data analysis methods are demonstrated by simulation results. It also shows a feasible test structure that can be incorporated on chip to test the analog functions
Keywords :
binary sequences; built-in self test; data analysis; integrated circuit testing; mixed analogue-digital integrated circuits; transient response; ASIC testing; BIST; analog functions; data analysis methods; fault detection capability; impulse response estimation; integrated circuit; mixed-signal circuit; onchip test structure; pseudo-random binary sequence; system level testing; test analysis methods; Analog circuits; Analytical models; Binary sequences; Circuit testing; Data analysis; Electrical fault detection; Impulse testing; Integrated circuit testing; Mixed analog digital integrated circuits; System testing;
Conference_Titel :
Electronics, Circuits and Systems, 2000. ICECS 2000. The 7th IEEE International Conference on
Conference_Location :
Jounieh
Print_ISBN :
0-7803-6542-9
DOI :
10.1109/ICECS.2000.913050
