System level testing of analog functions in a mixed-signal circuit

Author

Al-Qutayri, Mahmoud A.

Author_Institution

Etisalat Coll. of Eng., Emirates Telecommun. Corp., Sharjah, United Arab Emirates

Volume

2

fYear

2000

fDate

2000

Firstpage

1026

Abstract

This paper outlines the problems of testing analog circuits in general and those in a mixed-signal integrated circuit in particular. It proposes a system level testing technique based on the excitation of the circuit-under-test with a pseudo-random binary sequence and subsequent estimation of its impulse response. The fault detection capability of the test and data analysis methods are demonstrated by simulation results. It also shows a feasible test structure that can be incorporated on chip to test the analog functions

Keywords

binary sequences; built-in self test; data analysis; integrated circuit testing; mixed analogue-digital integrated circuits; transient response; ASIC testing; BIST; analog functions; data analysis methods; fault detection capability; impulse response estimation; integrated circuit; mixed-signal circuit; onchip test structure; pseudo-random binary sequence; system level testing; test analysis methods; Analog circuits; Analytical models; Binary sequences; Circuit testing; Data analysis; Electrical fault detection; Impulse testing; Integrated circuit testing; Mixed analog digital integrated circuits; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2000. ICECS 2000. The 7th IEEE International Conference on

Conference_Location

Jounieh

Print_ISBN

0-7803-6542-9

Type

conf

DOI

10.1109/ICECS.2000.913050

Filename

913050