Title :
Noisy feedback schemes and rate-error tradeoffs from stochastic approximation
Author :
Kumar, Utsaw ; Laneman, J.N. ; Gupta, Vijay
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fDate :
June 28 2009-July 3 2009
Abstract :
It is known that noiseless feedback does not increase the capacity of memoryless channels. However, such feedback can considerably increase the reliability or reduce the coding complexity of schemes that approach capacity. One might hope for the same to be (at least partially) true of noisy feedback. This paper develops a new class of coding schemes for additive white noise channels with feedback corrupted by additive white noise, focusing much of the results and discussion on the Gaussian case. These schemes are variants of the well-known Schalkwijk-Kailath (SK) coding scheme and are based upon simple techniques from stochastic approximation. Specifically, instead of the classic Robbins-Munro approach to stochastic approximation originally used in the SK scheme, we employ more recent techniques from Kushner. The resulting schemes enable a tradeoff between transmission rate and error performance in the presence of noisy feedback even as the number of iterations becomes large.
Keywords :
AWGN channels; channel capacity; channel coding; computational complexity; feedback; mean square error methods; memoryless systems; AWGN channel; SK coding scheme; Schalkwijk-Kailath coding scheme; additive white Gaussian noise channel; classic Robbins-Munro approach; coding complexity reduction; mean squared error; memoryless channel capacity; noiseless feedback scheme; noisy feedback scheme; rate-error tradeoff; stochastic approximation algorithm; AWGN; Additive white noise; Capacity planning; Channel capacity; Decoding; Feedback; Gaussian noise; Memoryless systems; Stochastic processes; Stochastic resonance;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5205960