• DocumentCode
    2990668
  • Title

    Enhancing the reliability of C and N accounting in economic activities : Integration of bio-geochemical cycle with Eco-LCA

  • Author

    Singh, Shweta ; Bakshi, Bhavik R.

  • Author_Institution
    William G. Lowrie Dept. of Chem. & Biomol. Eng., Ohio State Univ. in Columbus, Columbus, OH, USA
  • fYear
    2010
  • fDate
    17-19 May 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The resilience of earth systems depend on delicate balance of several natural cycles and phenomena. Recently, scientists have enumerated few of the significant Earth-system processes and their boundaries which should not be transgressed in order to make human activities sustainable. It was found that we have already exceeded some of the safe operating limits, which motivates the integration of bio-geochemical cycles with Life Cycle Assessment (LCA) techniques to make more sustainable decisions. The framework of Ecologically Based Life Cycle Assessment (Eco-LCA) is capable to capture the role of the bio-geochemical cycles in LCA. This article focuses on developing Carbon and Nitrogen Life Cycle Inventory by combining Eco-LCA framework with these nutrient cycle flows. It highlights the need of such comprehensive accounting and motivates the need of data collection for interaction of technical and natural systems.
  • Keywords
    carbon; ecology; environmental economics; inventory management; nitrogen; product life cycle management; reliability; sustainable development; C-and-N accounting; biogeochemical cycle; carbon-nitrogen life cycle inventory; earth-system processes; eco LCA; ecologically-based life cycle assessment; nutrient cycle flow; reliability; sustainability; Carbon dioxide; Earth; Ecosystems; Environmental economics; Fuel economy; Global warming; Humans; Nitrogen; Protocols; Resilience; Carbon Footprint; Inout-Output Model; Life Cycle Assessment; Nitrogen Footprint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sustainable Systems and Technology (ISSST), 2010 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    978-1-4244-7094-5
  • Type

    conf

  • DOI
    10.1109/ISSST.2010.5507712
  • Filename
    5507712