DocumentCode :
2990712
Title :
Reliability research on the thermal deformation and thermal stress of the metal packaging with low resistance and high electric current
Author :
Bai, Rui ; Jia, Songlian ; Sun, Xuewei ; Deng, Bing ; Li, Xide ; Lin, Le ; Zhuang, Zhuo ; Yang, Yu ; Wang, Shuidi ; Zhang, Zhonghui
Author_Institution :
Dept. of Eng. Mech., Tsinghua Univ., Beijing, China
fYear :
2003
fDate :
28-30 Oct. 2003
Firstpage :
401
Lastpage :
406
Abstract :
Thermal deformations and stresses of packaging structures were investigated by both experimental and numerical methods. Laser speckle interferometry was used as the experimental method to test the coefficient of thermal expansion (CTE) of the metal composite leads and the thermal deformations of the entire packaging structures due to the change of temperature from room-temperature to 150/spl deg/C. ABAQUS/standard finite element (FE) code was used to simulate the thermal deformations and stresses from room-temperature to 150/spl deg/C for the-packaging structures. The results of numerical simulations were in good agreement with those of experiments. It showed that the predicted thermal stresses and deformations in the working condition were qualitatively reliable. Moreover, the technique of element deactivation and activation was used in the FE analysis to simulate the manufacturing process of the packaging structures cooled from 779/spl deg/C to room-temperature. The residual thermal deformations and stresses during the process were obtained.
Keywords :
deformation; electronic speckle pattern interferometry; electronics packaging; finite element analysis; reliability; thermal expansion; thermal stresses; 150 degC; 293 to 298 K; 779 degC; coefficient of thermal expansion; electronic packaging; finite element methods; high electric current packaging; laser speckle interferometry; low resistance packaging; manufacturing process cooling; metal composite lead CTE; metal packaging thermo-mechanical reliability; residual thermal deformations; thermal stresses; Current; Electric resistance; Interferometry; Laser transitions; Packaging; Residual stresses; Speckle; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Proceedings, 2003. ICEPT 2003. Fifth International Conference on
Conference_Location :
Shanghai, China
Print_ISBN :
0-7803-8168-8
Type :
conf
DOI :
10.1109/EPTC.2003.1298770
Filename :
1298770
Link To Document :
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