• DocumentCode
    2990774
  • Title

    On the power dependence of extraneous microwave fields in atomic frequency standards

  • Author

    Jefferts, S.R. ; Shirley, J.H. ; Ashby, N. ; Heavner, T.P. ; Donley, E.A. ; Levi, F.

  • Author_Institution
    Div. of Time & Frequency, NIST, Boulder, CO, USA
  • fYear
    2005
  • fDate
    29-31 Aug. 2005
  • Abstract
    We show that the frequency bias caused by distributed cavity phase has a strong dependence on microwave power. We also show that frequency biases associated with microwave leakage have distinct signatures in their dependence on microwave power and the physical location of the leakage interaction with the atom.
  • Keywords
    frequency standards; microwaves; atomic frequency standards; distributed cavity phase; extraneous microwave fields; microwave leakage; microwave power; Atomic clocks; Doppler shift; Frequency conversion; Laser beams; Laser theory; Masers; NIST; Resonance; Tellurium; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
  • Print_ISBN
    0-7803-9053-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2005.1573910
  • Filename
    1573910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2990774