DocumentCode :
2990861
Title :
Nonlinear dynamic model of credit risk contagion in CRT market
Author :
Chen Ting-qiang ; Yin Qun-yao ; He Jian-min
fYear :
2012
fDate :
20-22 Sept. 2012
Firstpage :
250
Lastpage :
256
Abstract :
In this article, we build a nonlinear dynamics model of credit risk contagion in CRT market based on the connections of the complex relationship network between participants in CRT market only include Newman-Watts length scale connection and long distance connection, and study its dynamic behaviors. We find that, firstly, the increase of the effective rate of credit risk contagion can make the status curve of credit risk contagion happen some significant changes, further engender the Hopf bifurcation and chaos phenomenon in the process of credit risk contagion through experimental simulation. Secondly, the increase of the nonlinear resistance coefficient make Hopf bifurcation and chaos phenomena happen in advance. Thirdly, there are series of periodic windows in the chaos interval inside, in which present three intertwined state about Hopf bifurcation, pour bifurcation and chaos.
Keywords :
bifurcation; chaos; credit transactions; marketing; nonlinear dynamical systems; risk management; CRT market; Hopf bifurcation; Newman-Watts length scale connection; chaos interval; chaos phenomenon; complex relationship network; credit risk contagion process; credit risk transfer; effective credit risk contagion rate; experimental simulation; long distance connection; nonlinear dynamic model; nonlinear resistance coefficient; periodic windows; pour bifurcation; status curve; Bifurcation; Chaos; Mathematical model; Nonlinear dynamical systems; Oscillators; Resistance; Stability analysis; CRT market; Chaos; Hopf bifurcation; credit risk contagion; experimental simulation; nonlinear dynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management Science and Engineering (ICMSE), 2012 International Conference on
Conference_Location :
Dallas, TX
ISSN :
2155-1847
Print_ISBN :
978-1-4673-3015-2
Type :
conf
DOI :
10.1109/ICMSE.2012.6414191
Filename :
6414191
Link To Document :
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