DocumentCode :
2991038
Title :
Design of 100nm Single-Electron Transistor (SET) by 2D TCAD Simulation
Author :
Rasmi, Amiza ; Hashim, Uda ; Mat, Abdul Fatah Awang
Author_Institution :
UPM-MTDC, Serdang
fYear :
2006
fDate :
Oct. 29 2006-Dec. 1 2006
Firstpage :
367
Lastpage :
372
Abstract :
One of the great problems in current large-scale integrated circuits (LSIs) is increasing power dissipation in a small silicon chip. Single-electron transistor (SET) which operate by means of one-by-one electron transfer, small size and consume very low power are suitable for achieving higher levels of integration. In this paper, SET is designed with 100 nm gate length and 10 nm gate width is successfully simulated by Synopsys TCAD. The power of SET device that obtained from simulation is 3.771 times 10-9 Watt for fixed current and 3.3565 times 10-9 Watt if fixed the gate voltage, VG, and the capacitance of this device is 0.4297 aF. These results were achieved at room temperature operation.
Keywords :
circuit simulation; integrated circuit design; single electron transistors; 2D TCAD simulation; LSI; SET; Synopsys TCAD; large-scale integrated circuits; one-by-one electron transfer; power dissipation; silicon chip; single-electron transistor; Capacitance; FETs; Impedance; Integrated circuit technology; Large scale integration; Low voltage; Medical simulation; Nanoscale devices; Single electron devices; Single electron transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
Type :
conf
DOI :
10.1109/SMELEC.2006.381083
Filename :
4266633
Link To Document :
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