DocumentCode :
2991093
Title :
Development of SiC/MgO Distributed Bragg Reflector using RF Magnetron Sputtering Technique
Author :
Anuar, M.S.K. ; Soetedjo, Hariyadi ; Sharizal, A.M. ; Sufian, S.M. ; Boon, T.G. ; Saadah, A.R. ; Razman, Y.M. ; Fatah, A.M.A.
Author_Institution :
UPM-MTDC, Serdang
fYear :
2006
fDate :
Oct. 29 2006-Dec. 1 2006
Firstpage :
378
Lastpage :
381
Abstract :
A Bragg mirror structure is an essential part for vertical cavity surface emission laser (VCSEL) applications. High optical reflectance at required stopband width is one of major concern by means of application requirements. For this purpose, Bragg mirrors consisting of SiC/MgO multilayers have been developed using an RF magnetron sputtering technique at room temperature. These structures have been characterized using various measurement techniques like ellipsometry, reflectance spectroscopy, Fourier transform infrared (FTIR) spectroscopy, scanning electron microscopy (SEM) and X-ray diffraction (XRD) technique. From these measurements, it was confirmed that mirror materials were deposited on the substrates. For application requirement, the DBR mirror structure fabricated using only a seven period SiC/MgO multilayered structure produced the expected stop-band at 850 nm wavelength with high reflectivity of 95%.
Keywords :
Fourier transform spectra; X-ray diffraction; distributed Bragg reflectors; ellipsometry; infrared spectra; laser cavity resonators; laser mirrors; magnesium compounds; optical multilayers; reflectivity; scanning electron microscopy; silicon compounds; sputter deposition; Bragg mirror structure; DBR mirror structure; Fourier transform infrared spectroscopy; RF magnetron sputtering technique; SEM; SiC-MgO; VCSEL; X-ray diffraction; XRD; distributed Bragg reflector; ellipsometry; multilayers; optical reflectance; reflectance spectroscopy; reflectivity; scanning electron microscopy; vertical cavity surface emission laser; wavelength 850 nm; Distributed Bragg reflectors; Infrared spectra; Mirrors; Radio frequency; Reflectivity; Scanning electron microscopy; Silicon carbide; Spectroscopy; Sputtering; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
Type :
conf
DOI :
10.1109/SMELEC.2006.381085
Filename :
4266635
Link To Document :
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