Title :
Mixed-level sequential test generation using a nine-valued relaxation algorithm
Author :
Chen, C.-H. ; Abraham, J.A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
A powerful automatic test generation system which uses a novel nine-valued relaxation algorithm is presented. This algorithm, which brings together the relaxation technique from circuit simulation and a nine-valued algebra from sequential circuit test generation, is applied to the strongly connected DC coupling components so that for every possible choice of node values a stable state could be achieved through relaxation. Circuits which use bidirectional transistors and depend on the transistor strengths for correct operation are properly handled by this algorithm. A method called DC path sensitization is used to detect the stuck-at, stuck-on, stuck-open and bridging faults for CMOS transistors. The algorithm has been implemented in C++ and preliminary results are very promising. The algorithm can easily be extended to different circuit models and other technologies, or be incorporated into a higher level test generation system.<>
Keywords :
CMOS integrated circuits; automatic testing; integrated circuit testing; many-valued logics; sequential circuits; CMOS transistors; DC path sensitization; automatic test generation system; bidirectional transistors; bridging faults; circuit simulation; mixed-level sequential test generation; nine-valued algebra; nine-valued relaxation algorithm; sequential circuit test generation; strongly connected DC coupling components; stuck at faults; stuck on faults; stuck open faults; transistor strengths; Algebra; Automatic testing; Circuit simulation; Circuit testing; Coupling circuits; DC generators; Power generation; Sequential analysis; Sequential circuits; System testing;
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
DOI :
10.1109/ICCAD.1990.129888