Title :
The maximum likelihood probability of unique-singleton, ternary, and length-7 patterns
Author :
Acharya, Jayadev ; Orlitsky, Alon ; Pan, Shengjun
Author_Institution :
CSE Dept., UCSD, La Jolla, CA, USA
fDate :
June 28 2009-July 3 2009
Abstract :
We derive several pattern maximum likelihood (PML) results, among them showing that if a pattern has only one symbol appearing once, its PML support size is at most twice the number of distinct symbols, and that if the pattern is ternary with at most one symbol appearing once, its PML support size is three. We apply these results to extend the set of patterns whose PML distribution is known to all ternary patterns, and to all but one pattern of length up to seven.
Keywords :
maximum likelihood estimation; pattern matching; length-7 pattern; maximum likelihood probability; pattern maximum likelihood; ternary pattern; unique-singleton pattern; Convergence; Frequency estimation; Genetics; Maximum likelihood estimation; Pattern analysis; Probability; Statistical distributions; Tail;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5206016