A study on the metal-flanged open-ended coaxial line terminating in a conductor-backed dielectric layer

Author

Fan, Siqi ; Misra, Devendra

Author_Institution

Dept. of Electr. Eng., Wisconsin Univ., Milwaukee, WI, USA

fYear

1990

fDate

13-15 Feb 1990

Firstpage

43

Lastpage

46

Abstract

A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown that, for d⩾2b, the results are very close to those for the infinitely thick dielectric medium. The results are expected to be useful in developing suitable procedures for measuring the electrical properties of samples with small thicknesses

Keywords

capacitance; coaxial cables; dielectric measurement; electric admittance; electromagnetic fields; transmission line theory; EM field analysis; aperture admittance; aperture fields; capacitance; conductor-backed dielectric layer; dielectric measurement; metal-flanged open-ended coaxial line; microwave reflectometry; spectral domain; Admittance; Apertures; Biological materials; Capacitance; Coaxial components; Dielectrics; Electric variables measurement; Electromagnetic measurements; Frequency; Methanol;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/IMTC.1990.65956

Filename

65956