DocumentCode :
2991985
Title :
Dynamic characterization of Semiconductor Ring Lasers: Frequency response and linewidth enhancement factor
Author :
Zanola, Marco ; Mezosi, Gabor ; Furst, Sandor ; Sorel, Marc ; Giuliani, Guido
Author_Institution :
Dipt. di Elettron., Univ. di Pavia, Pavia
fYear :
2008
fDate :
14-18 Sept. 2008
Firstpage :
127
Lastpage :
128
Abstract :
The frequency response and alpha factor of monolithic semiconductor ring lasers (SRLs) with 150 micron radius are measured using an all-optical modulation technique, yielding a -3 dB, frequency of 11 GHz and alpha factor of 2.4.
Keywords :
frequency response; laser beams; laser cavity resonators; optical modulation; ring lasers; semiconductor lasers; all-optical modulation technique; alpha factor; dynamic characterization; frequency 11 GHz; frequency response; linewidth enhancement factor; monolithic semiconductor ring lasers; radius 150 mum; Current measurement; Fiber lasers; Flip-flops; Frequency measurement; Frequency response; Optical bistability; Optical modulation; Optical waveguides; Ring lasers; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Laser Conference, 2008. ISLC 2008. IEEE 21st International
Conference_Location :
Sorrento
Print_ISBN :
978-1-4244-1782-7
Electronic_ISBN :
978-1-4244-1783-4
Type :
conf
DOI :
10.1109/ISLC.2008.4636042
Filename :
4636042
Link To Document :
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