DocumentCode :
2992060
Title :
Using ultrasonic energy for reducing ACF bonding process time
Author :
Tae-Young Jang ; Yun, Won-Su ; Soo-Hyun Kim ; Kim, Kyung-Soo
Author_Institution :
Dept. of Mechanical Engineering, KAIST, 335 Gwahang-no, Daedeuk Science Town, Daejeon, KOREA
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
In this paper, we develop the novel ultrasonic bonding method for mounting LCD driver IC which has a number of small bumps with high pin-density. Since the materials for bumps and pads are different metals, the an-isotropic conductive film (ACF) is used for adhesion. The conventional methods based on the thermal energy under pressure suffer from the high failure rate at high temperature process and, in particular, the low productivity due to the long bonding process time. To avoid these, the thermo-compression ultrasonic approach is newly proposed, and, validated by experiments. The experimental results show that lower values of bonding pressure and temperature than recommended by the ACF specification can be adopted for reliable bonding, which proves the feasibility of the ultrasonic bonding technique. In addition, we address a new concept of horn design for high precision bonding. Since the proposed method is utilizing the mechanical vibration, the misalignment between bumps and pads may be the major issue. To solve this, the active controllable horn design is further discussed.
Keywords :
Bonding processes; Closed loop systems; Fixtures; Flip chip; Nickel; Printers; Printing; Semiconductor device measurement; Semiconductor device packaging; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507776
Filename :
5507776
Link To Document :
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