DocumentCode
2992063
Title
Advances in processing techniques for silicon micromechanical devices with smooth surfaces
Author
Guckel, H. ; Sniegowski, J.J. ; Christenson, T.R.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear
1989
fDate
20-22 Feb 1989
Firstpage
71
Lastpage
75
Abstract
The use of fine-grained polysilicon in the development of micromechanical devices (e.g. bearings, with smooth surfaces) is discussed. Fine-grained polysilicon can be produced with surface roughness near 8 Å r.m.s. (root mean square). The ability to anneal films of this type into tension eliminates size restrictions which are caused by compressive buckling. The use of these films in micromechanical devices has been restricted because hydrogen-fluoride-etched structures are covered by an etch residue which leads to contact welding. Contact between opposing surfaces is induced mainly by surface tension effects. This problem can be avoided by removing the deflection mechanism. Thus, freezing of a water-methanol rinse after sacrificial etching all but eliminates surface tension. Removal of the ice mixture via sublimation at 0.15 mbar occurs readily. Free-standing structures with smooth surfaces and small gaps are then passivated by silicon nitride deposition or other techniques
Keywords
elemental semiconductors; semiconductor technology; silicon; 0.15 mbar; HF etching; Si3N4-Si passivation; bearings; contact welding; etch residue; film annealing; fine-grained; free-standing structures; freezing; ice mixture; micromechanical devices; passivation; polycrystalline Si; processing techniques; sacrificial etching; size restriction elimination; smooth surfaces; sublimation; surface roughness; surface tension elimination; tension; water-methanol rinse; Annealing; Etching; Ice; Micromechanical devices; Root mean square; Rough surfaces; Silicon; Surface roughness; Surface tension; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1989, Proceedings, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. IEEE
Conference_Location
Salt Lake City, UT
Type
conf
DOI
10.1109/MEMSYS.1989.77964
Filename
77964
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