• DocumentCode
    2992109
  • Title

    Super heavy 6.0 mils Cu wire ball bonding

  • Author

    Tan Poh Chai ; Joe Tan ; Sivakumar, M. ; Premkumar, J. ; James Song ; Wong, Y. M.

  • Author_Institution
    ASM Technology Singapore, 2 Yishun Avenue, Singapore 768924
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The quest to replace wire material from gold (Au) to Copper (Cu) in wire bonding interconnect has been in the industry since few decades. As the Cu wire bonding manufacturing process matures, the idea of substituting Al wedge bond with Cu ball bond is mooted. Such substitution could potentially reap benefits of lower machine cost of ownership and better utilization of silicon real estate. It also comes with better conductivity, slower intermetallic growth and possibly cheaper material price. However, the associated challenges such as hardness and oxidation could be overwhelming and requires a careful assessment. The objective of this study is to provide insight of the 6.0 mils Cu wire bonding process. 6.0 mils Cu wire is the key candidate in this Al - Cu wire substitution idea. Bonding interaction of Cu wire, chip & lead are studied experimentally.
  • Keywords
    Bonding; Conductivity; Copper; Costs; Gold; Manufacturing industries; Manufacturing processes; Metals industry; Silicon; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507778
  • Filename
    5507778