Title :
Toward Physically-Adaptive Computing
Author :
Zick, Kenneth M. ; Hayes, John P.
Author_Institution :
EECS Dept., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
Sept. 27 2010-Oct. 1 2010
Abstract :
As semiconductor technology approaches the atomic scale, electronic systems are increasingly burdened by physical variations and uncertainty. Traditionally-designed systems lack an ability to adapt to these fine-grained effects and are thus becoming more inefficient, error-prone, and subject to early wear out. This paper describes the paradigm of physically-adaptive computing (PAC), in which systems learn physical parameters and adapt with fine granularity in the field. We outline an architecture for an adaptation agent and investigate two key aspects of the adaptive process: self-characterization and physical self-optimization. A case study is presented involving random variations in latch reliability. We conducted experiments on a model of a PAC system with physical data obtained from actual field-programmable gate array (FPGA) hardware. Our results show that across 15 benchmark circuits the mean time between failures improved by an average of 30% via low-cost self-adaptation and by 45% assuming assistance from a remote server. Physical self-adaptation and assisted adaptation will both play an important role in achieving computational systems with atomic-scale features.
Keywords :
circuit optimisation; electronic engineering computing; field programmable gate arrays; monolithic integrated circuits; semiconductor technology; electronic systems; physical self optimization; physically adaptive computing; self characterization; semiconductor technology; Field programmable gate arrays; Hardware; Latches; Reliability; Sensors; Servers; Substrates; FPGA; reconfiguration; reliability; self-adaptation; sensing; single event upset; variation;
Conference_Titel :
Self-Adaptive and Self-Organizing Systems (SASO), 2010 4th IEEE International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4244-8537-6
Electronic_ISBN :
978-0-7695-4232-4
DOI :
10.1109/SASO.2010.13