DocumentCode :
2992296
Title :
The design experience reuse system modeling and external locus sharing of enterprise resource
Author :
Li, Hui ; Mao, Jun ; Li, Xinhong ; Xin, Zhongwei
Author_Institution :
Liaoning Tech. Univ., Fuxin, China
fYear :
2009
fDate :
26-29 Nov. 2009
Firstpage :
9
Lastpage :
12
Abstract :
According to the analysis of design practice and reuse, the design experience reuse system model and design experience reuse process model was proposed. The design experience reuse system modeling includes the product case data and subsystem of design reuse. The main function is to support the visible program design, carry out the UI intercommunion. The designer changes the assembly structure of parts dynamically in design process, improving the support degree for visible program. The modeling block of reuse design experience is the key problem to program design for reuse model of design experience, which provides the theory framework for the calculation procedure, and determines the interaction relation between the reuse model of design experience and the subsystem of design reuse. Design reuse on enterprise resource and external locus sharing was realized, through the XML mark processing to the product structure physics models of machine products development model and building up in the international standard XML text.
Keywords :
XML; design engineering; enterprise resource planning; product design; software reusability; UI intercommunion; XML mark processing; design experience reuse process model; design experience reuse system model; enterprise resource; external locus sharing; machine products development model; product case data; product case subsystem; product structure physics models; visible program design; Assembly; Electronic mail; Modeling; Personnel; Physics; Process design; Product design; Product development; Standards development; XML; Case; Design reuse; Enterprise resource; Model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Industrial Design & Conceptual Design, 2009. CAID & CD 2009. IEEE 10th International Conference on
Conference_Location :
Wenzhou
Print_ISBN :
978-1-4244-5266-8
Electronic_ISBN :
978-1-4244-5268-2
Type :
conf
DOI :
10.1109/CAIDCD.2009.5374856
Filename :
5374856
Link To Document :
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