DocumentCode :
2992377
Title :
Power MOSFET macromodel accounting for temperature dependence: parameter extraction and simulation
Author :
Leonardi, C. ; Frisina, F. ; Letor, R. ; Raciti, A.
Author_Institution :
STMicroelectron., Catania, Italy
fYear :
1998
fDate :
1998
Firstpage :
37
Lastpage :
47
Abstract :
A new PSpice model of power MOSFETs has been developed aiming to account for the parameter variations with the temperature. A new computer aided design package that helps the designer in the parameter extraction procedure is discussed in detail. The model accuracy has been tested by comparison of the simulated waveforms with the experimental traces relative to actual devices
Keywords :
SPICE; electronic design automation; power MOSFET; semiconductor device models; computer aided design package; parameter extraction; parameter extraction procedure; power MOSFET macromodel; simulated waveforms; simulation; temperature dependence; Circuit simulation; Circuit testing; Computational modeling; MOSFET circuits; Parameter extraction; Parasitic capacitance; Power MOSFET; Power system modeling; Temperature dependence; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers in Power Electronics, 1998. 6th Workshop on
Conference_Location :
Cernobbio
ISSN :
1093-5142
Print_ISBN :
0-7803-4856-7
Type :
conf
DOI :
10.1109/CIPE.1998.779656
Filename :
779656
Link To Document :
بازگشت