Title :
Solder void reduction on solder die attach for SIP-LGA
Author :
Ho Tuck Ming ; Lily Khor
Author_Institution :
Carsem Technology Center, Carsem (M) Sdn Bhd S-Site, Lot 52986, Taman Meru Industrial Estate, Jelapang, P.O.Box 380, 30720 Ipoh, Perak, Malaysia
Abstract :
SIP or System In Package as its name suggests is a package that consist of a combination of dies (asics, memory, mosfets etc), passive components or shielding in an IC package format. Due to design and layout complexity, it is normally required to be housed in a substrate based packaging. The connection of silicon die to package can be in the form of wire-bond, flipchip, epoxy die attach,or solder die attach. In cases where solder die attach is used, the challenge would lie in the ability to produce the least die attach void. The presence of solder void underneath the die is not desirable as it has thermal and in some cases electrical impact in the performance of the device. Solder voids, depending on its magnitude can also reduce the reliability and functionality of the device.
Keywords :
Assembly; Integrated circuit packaging; Lead; MOSFETs; Microassembly; Powders; Printing; Silicon; X-ray detection; X-ray detectors;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang, Malaysia
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2008.5507790