Title :
Performance of low loss, high speed interconnects for multi-GHz digital systems
Author :
Jayaraj, K. ; Moravec, T.J. ; Thompson, R.L. ; Schwab, D.J. ; Gilbert, B.K.
Author_Institution :
Honeywell Sensors & Signal Processing Lab., Bloomington, MI, USA
Abstract :
Preliminary frequency-, time-, and digital-domain testing and electromagnetic simulations indicate that the striplines and microstrip lines of Honeywell´s thin-film multilayer (TFML) technology are suitable for high-performance digital systems that require operation at frequencies greater than 1 GHz. The return loss was typically -20 dB, which indicates the ability to design and fabricate controlled impedance lines with Honeywell´s TFML technology. The 1- and 2-GHz digital-domain test measurements did not appear to be affected significantly by the reflections. The insertion loss of approximately -2.5 dB/in. at 9 GHz is acceptable for relatively short signal interconnect lines which, in any event, are required to minimize interchip propagation delays in a functioning system. Predictions from the Mayo electromagnetic modeling package show excellent agreement with measured signal and crosstalk waveforms. The crosstalk between adjacent lines is less than -20 dB even when the coupled line length is very long (>6 in.). Vias and via pads show negligible effects on insertion and return losses up to a frequency of 9 GHz. Large impedance mismatches severely affect the return losses, and therefore should be avoided. Stubs in the interconnect must be kept smaller than 1/4 of the smallest wavelength within the signal bandwidth
Keywords :
digital integrated circuits; hybrid integrated circuits; microwave integrated circuits; thin film circuits; 1 to 9 GHz; MCP; Mayo electromagnetic modeling package; TFML technology; controlled impedance lines; crosstalk; digital-domain testing; electromagnetic simulations; high speed interconnects; high-performance digital systems; impedance mismatches; insertion loss; interchip propagation delays; microstrip lines; multi-GHz digital systems; multichip packaging; reflections; return loss; striplines; thin film multilayer technology; via pads; Crosstalk; Electromagnetic measurements; Frequency; Impedance; Insertion loss; Microstrip; Performance loss; Stripline; System testing; Transistors;
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1989.40443